Fresnel diffraction

Introduction

The aim of this experiment is to investigate diffraction phenomena. It is possible to explore diffraction patterns for different objects and to investigate the influence of the object position relative to the position of the light source and the detector on the measured pattern. In a simulation model the dependence of the diffraction pattern on the nature and size of the different objects and on experimental parameters can be investigated and compared with the measured data.

Theoretical Background

If an object obstructs a coherent spherical wave front (light from a point source) then according to the principle of Huygens every light point in that plane of the object will generate secondary wave fronts. This will create a diffraction pattern at a certain distance from the object. The concepts as interference, diffraction and cornu-spiral are visualized and interactively presented in this experiment by means of applets.

Experimentation Method

A diffraction pattern can be measured if an object is placed in the wave front of the light source and the light detector scans in a plane perpendicular to the secondary wave fronts. The light intensities measured at different detector positions will result in a measured diffraction pattern. This diffraction pattern can be compared with the data of a simulation model.

Motivation to perform this experiment remotely

In this experiment good alignment is a time consuming element. If alignment is not a learning objective it is better to start with a working setup. It gives the student more time to investigate the different diffraction phenomena.

Setup

Short description

The point source which is needed in this experiment is created by means of a He-Ne laser and a spatial filter. For studying the diffraction phenomena it is possible to choose out of eight different objects placed in a carrousel and/or change the distance between the chosen object and the light source. A diffraction pattern can be measured by scanning the detector through the diffraction pattern. Light intensities will be recorded by the data acquisition board in the computer.

Schematic view

Setup

Remote Interface

Variables that can be controlled remotely

Variables that can be measured remotely

What is visualized remotely?

Educational

Learning Objectives

Target Group

Professional Relevance